Module samples tested
Quality & Reliability Testing · M144(HC) Modules
Philadelphia Solar M144(HC) Modules Demonstrate Strong Resistance to Potential-Induced Degradation
A SolarPTL test of four M144(HC) module samples reported minimal changes in power output following potential-induced degradation (PID) testing.
SolarPTL · M144(HC)
Test results at a glance
Power changes as reported in the company announcement; these figures do not guarantee performance under all operating conditions.
Samples with a slight power gain
Power-gain range
Largest power decline recorded
Independent laboratory report
SolarPTL results for four module samples
According to test report R1-PHL210121.04, issued by SolarPTL, four M144(HC) modules from Philadelphia Solar underwent potential-induced degradation testing under IEC TS 62804-1.
Three of the four samples registered slight power gains ranging from 0.1% to 0.8%, while the remaining sample showed a 0.4% power decline. The original announcement cites a 5% maximum permitted power decline in the context of the test.
These results indicate limited changes in power output for the tested samples under the report’s conditions. They do not imply that field degradation is impossible.
Technology explained
What is Potential-Induced Degradation (PID)?
Potential-induced degradation, or PID, is a phenomenon that can affect PV module performance when a high electrical potential exists between solar cells and grounded surrounding components. Moisture, wet conditions, and electrically conductive contaminants on module surfaces may increase susceptibility to this form of degradation.
Electrical potential
Voltage differences between cells and grounded structures may contribute to PID mechanisms.
Humidity and exposure
Damp or wet conditions can make some modules more susceptible to degradation.
Long-term reliability
PID testing helps assess how modules respond to defined high-voltage stress conditions.
Testing context
Recorded loss below the limit cited in the announcement
The sample showing a decrease registered a −0.4% power change, against the 5% maximum decline cited in the announcement. The other three samples showed slight gains after testing.
Test reportR1-PHL210121.04
Referenced specificationIEC TS 62804-1
Technical clarification: Sample results and test report details are taken from the supplied company announcement. The original text contains a typographical error in the standard number; it is rendered here as IEC TS 62804-1. The original laboratory report has not been independently reviewed.
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