Philadelphia Solar Mono Half Cell Modules continue to show an outstanding performance under testing.
M144(HC) Module has approached zero degradation when tested for
Potential Induced Degradation (PID).

Reference to report number R1-PHL210121.04 issued by SolarPTL; four modules were subjected to PID test according to IEC TS 628041-.
Three out of the four tested modules have shown a slight power gain varied from 0.1% to 0.8%. while the last one has shown a degradation reached 0.4%. knowing that the maximum allowed degradation of maximum output power is 5%.

PID is one of the factors that might affect module’s durability. The main cause of PID is the high voltage between the encapsulated solar cells and the front glass surface, which is grounded through the frame or substructure. PID degradation is most active in wet or damp environments, and in environments prone to soiling of modules with conductive, acidic, caustic, or ionic species that lead to increased conduction on the module surfaces.


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